Self-Supervised Learning for Industrial Image Anomaly Detection by Simulating Anomalous Samples
نویسندگان
چکیده
Abstract Industrial image anomaly detection (AD) is a critical issue that has been investigated in different research areas. Many works have attempted to detect anomalies by simulating anomalous samples. However, how simulate abnormal samples remains significant challenge. In this study, method for designed. First, the object category, patch extraction and paste are designed ensure extracted patches come from objects pasted image. Second, based on statistical analysis of various anomalies’ presence, combination data augmentation proposed cover as much possible. The evaluated MVTec AD BTAD datasets; experimental results demonstrate our achieves an overall AUC 97.6% datasets, outperforming baseline 1.5%, improvement over VT-ADL 4.3% demonstrating method’s effectiveness generalization.
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ژورنال
عنوان ژورنال: International Journal of Computational Intelligence Systems
سال: 2023
ISSN: ['1875-6883', '1875-6891']
DOI: https://doi.org/10.1007/s44196-023-00328-0